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Rietveld Refinement: Practical Powder Diffraction Pattern Analysis Using Topas (de Gruyter Stem)
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Rapid Modal Analysis of Some Felsic Rocks from Calibrated X-ray Diffraction Patterns
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MicroComputed Tomography: Methodology and Applications, Second Edition
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Electron Microscopy and Analysis
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Interferogram Analysis For Optical Testing (Optical Engineering Book 84)
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Fringe Pattern Analysis: 8-9 August 1989 San Diego, California (Proceedings of Spie)
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Introduction to X-Ray Powder Diffractometry (Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its App…
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Antenna Theory and Microstrip Antennas
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Introduction to Scanning Transmission Electron Microscopy (Royal Microscopical Society Microscopy Handbooks)
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Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications
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Physics
Software
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Theory and applications of interference of light waves, Interference of light waves, The interferometer, Light wave analysis, Measurement of standard meter in light waves, Diffraction, Testing of optical surfaces, Diffraction gratings, The ruling of diffraction gratings, The echelon grating, Application of interference to astronomical investigation, Velocity of light, Effects of motion of the medium on velocity of light, Relativity, Metallic colors in birds and insects Studies in Optics (Paperback)
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Walsh Functions.- Self-similarity in Walsh Functions.- Computation of Farfield Diffraction Characteristics of radial Walsh Filters on the pupil of axisymmetric imaging systems.- Self-similarity in Transverse Intensity Distributions on the Farfield plane of self-similar radial Walsh Filters.- Self-similarity in Axial Intensity Distributions around the Farfield plane of self-similar radial Walsh Filters.- Self-similarity in 3D Light Distributions near the focus of self-similar radial Walsh Filters. Conclusion. • Author: Lakshminarayan Hazra,Pubali Mukherjee • ISBN:9789811028083 • Format:Paperback • Publication Date:2017-07-18
Teaching / Learning
These highly efficient, double axis, holographic diffraction grating lenses separate light from any source into its spectral components for study and analysis. Lenses are mounted in sturdy cardboard frames. Sold in sets of 10.
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Unites classical and modern photonics approaches, providing a thorough understanding of the interplay between plane waves, diffraction and modal analysis. Uniting classical and modern photonics approaches by presenting optical analyses as solutions of Maxwell’s equations, this unique book enables students and practising engineers to fully understand the similarities and differences between the different methods. The book begins with a thorough discussion of plane wave analysis, which provides a clear understanding of optics without considering boundary condition or device configuration. It then goes on to cover diffraction analysis of many applications, including a rigorous analysis of TEM waves using Maxwell’s equations with boundaries. Laser cavity modes and Gaussian beams are presented, modal analysis is covered, and approximation methods are discussed (including the perturbation technique, coupled mode analysis, and super mode analysis). With theory linked to practical examples throughout, it provides a clear understanding of the interplay between plane wave, diffraction and modal analysis, and how the different techniques can be applied to various areas including imaging, signal processing, and optoelectronic devices. Principles of Optics for Engineers (Hardcover)
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Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves. • ISBN:9783540405191 • Format:Hardcover • Publication Date:2003-11-26
